The process data section of the capability analysis graph consists of the following:

·    Upper and lower specification limits (LSL and USL) - the limits you specified.

·    Target - the target value you specified.

·    Sample mean - the sample mean.

·    Sample N - the total number of observations in your data.

·    Distribution parameters - Parameters for the distribution you chose to fit the data. These can either be estimated from the data or specified in the dialog box.

For the electronic device data:

·    Upper and lower specification limits (LSL and USL) - the LSL is 1000 and the USL was not given.

·    Target - the target is 2410.

·    Sample mean - the mean is 2396.53.

·    Sample N - 150 devices were measured.

·    Shape and scale - the parameters for the Weibull distribution. The shape is 8.596 and the scale is 2538.28, estimated using maximum likelihood method.