The process data section of the capability analysis graph consists of the following:

·    Upper and lower specification limits (USL and LSL) - the limits you specified.

·    Target - the target value you specified. Mean - the mean of all measurements, which is where the process is centered.

·    Sample N - the total number of observations in your data.

·    Overall standard deviation - a measure of the variation of all the measurements.

·    Between standard deviation - a measure of the variation between subgroups.

·    Within standard deviation - a measure of the variation within subgroups.

·    B/W standard deviation - a measure of the between/within standard deviation, calculated by combining the between- and within-subgroup variation.

For the coating data:

·    Upper and lower specification limits (USL and LSL) - LSL is 47 and the USL is 53.

·    Target - The target is 50.

·    Mean - The mean is 49.8829. Note that the mean is very close to the target of 50.0, which implies that the process is centered on target.

·    Sample N - 75 coatings were measured.

·    Overall standard deviation - The overall standard deviation is 0.838488.

·    Between standard deviation - The between standard deviation is 0.685488.

·    Within standard deviation - The within standard deviation is 0.40608.

·    B/W standard deviation - The b/w standard deviation is 0.79674.