|
|
发表于 2025-8-21 16:03:22
|
显示全部楼层
我的理解,主要原因还是在于Fab中很多生产场景,对ESD标准中的要求没法完全应用,相关标准参考JEDC625C标准,里面也说了CP前的制程并不完全适用,“a) 半导体制造商 - 从晶圆加工到成品设备装运。注意 本标准的某些要求在探针探查之前并不适用。在进行探针测量之前,制造商应采取适当的 ESD 预防措施,以尽量减少对器件的损坏。”
原文如下:
1.1 Applicable Users
a) Semiconductor Manufacturers - from wafer processing through shipment of finished devices. NOTE Some requirements of this standard are not applicable prior to probe. Prior to probe, the manufacturer should take appropriate ESD precautions to minimize damage to devices.
b) Semiconductor Processing/Testing Facilities - from receipt through shipment of finished devices. The requirements apply to all ESDS devices until they are considered scrap.
NOTE ESDS Device Distributors and Users may use this standard or ANSI/ESD S20.20 1.2 Applicable Device Types The device types for which these requirements are applicable include, but are not limited to, ESD- sensitive discrete and integrated circuit semiconductors, hybrids, multi-chip modules, optoelectronic devices, thin film passive devices and any device identified as ESD sensitive by the suppliers. |
|